JEOL JSM-7100F

Manufacturer:
JEOL

Model name:
JSM-7100F

Location:
HPM A52.2

Phone:
3 79 54

Price category:
SEM

Instrument contact:

Dr. Luiz Grafulha Morales

Lecturer at the Department of Earth Sciences

ScopeM
Otto-Stern-Weg 3
8093 Zürich
Switzerland

Brief description:

Multi-purpose high resolution FE SEM

Software:

Camera / detectors:

Secondary electrons (SE): LED
Backscattered electrons (BSE): RBEI
Energy-dispersive X-ray spectroscopy (EDX): Ametek-EDAX EDX detector (Si(Li) 30 mm²)
Wavelength-dispersive X-ray spectroscopy (WDX): Ametek-EDAX low energy X-ray spectrometer (LEXS)

Key features:

High Voltage: 0.2–30 kV
Emitter: Schottky Type FE
Vacuum modes: High vacuum
Gentle Beam System: high resolution images even at very low acceleration voltages and probe currents (beam deceleration)

Booking Rules

Exception for this system: Priority is given to the activities of the microscopy training program. At other times, respect the general booking rules.