Focused Ion Beam and Applications
Course Overview
The course on Focused Ion Beam (FIB) provides theoretical and hands-on learning, applying what is learned in lectures to hands-on sessions.
This 3-day block course provides FIB techniques to students with previous SEM experience. At the end of the course, students will be able to set-up a FIB-SEM session and characterize cross-sections. Students will also understand how to prepare TEM & APT samples and design a FIB experiment to solve research problems.
The content of the course is:
- Introduction to FIB theory and instrumentation.
- Discussion of FIB operation and applications.
- Lecture and demonstration on FIB automation.
- Practicals on FIB-SEM set-up and alignment.
- Practicals on cross-section and site-specific sample characterization.
- Practicals on sample preparation (TEM lamella/APT needles).
The FIB course runs once per semester.
ECTS points
1 credit for full course.
Course fee
Full course for Master Students of ETH Zurich: no fee
Full course for Academia: 260 CHF
Full course for all other participants 960 CHF
Lectures only: no fee
Number of Participants
The number of seats is limited, however, the lectures are open to all ScopeM users - registration is required, please use the FIB application form below to register your interest. Please note that there will be no credit for the lectures only course.
Dates for upcoming course
13th – 15th of May, 2024
How to apply
external pageFIB application formcall_made (application deadline: 2 weeks before the course starts). Master and PhD students are required to register on myStudies, course number 327-2140-00L.
Contact
For further information, please contact:
Dr. Peng Zeng
HPM D48
Tel: +41 44 633 8034
Email: